Texas Instruments ADS8504 Handleiding


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FEATURESAPPLICATIONS
DESCRIPTION
Successive Approximation Register and Control Logic
Clock
BUSY
Comparator
BYTE
CS
R/C
CDAC
Buffer
REF
CAP
± 10 V Input
5 kΩ
2 kΩ
9.8 kΩ
Internal
+2.5 V Ref
4 kΩ
Output
Latches
and
Three
State
Drivers
Three
State
Parallel
Data
Bus
ADS8504
SLAS434A–JUNE2005–REVISEDJUNE2007
12-BIT250-KSPSSAMPLINGCMOSANALOG-TO-DIGITALCONVERTER
•IndustrialProcessControl
•250-kHzSamplingRate
•DataAcquisitionSystems
•Standard±10-VInputRange
•DigitalSignalProcessing
•73-dBSINADWith45-kHzInput
•MedicalEquipment
•±0.45LSBMaxINL
•Instrumentation
•±0.45LSBMaxDNL
•12BitNoMissingCode
•±1LSBBipolarZeroErrors
TheADS8504isacomplete12-bitsamplingA/D
•±0.4PPM/°CBipolarZeroErrorDrift
converterusingstate-of-the-artCMOSstructures.It
•Single5-VSupplyOperation
containsacomplete12-bit,capacitor-based,SAR
A/DwithS/H,reference,clock,interfacefor
•Pin-CompatibleWithADS7804/05(LowSpeed)
microprocessoruse,and3-stateoutputdrivers.
and16-BitADS8505
TheADS8504isspecifiedata250-kHzsampling
•UsesInternalorExternalReference
rateoverthefulltemperaturerange.Precision
•FullParallelDataOutput
resistorsprovideanindustrystandard±10-Vinput
•70-mWTypPowerDissipationat250KSPS
range,whiletheinnovativedesignallowsoperation
fromasingle+5-Vsupply,withpowerdissipation
•28-PinSOICPackage
under100mW.
TheADS8504isavailableina28-pinSOICpackage
andisfullyspecifiedforoperationovertheindustrial
-40°Cto85°Ctemperaturerange.
Pleasebeawarethatanimportantnoticeconcerningavailability,standardwarranty,anduseincriticalapplicationsofTexas
Instrumentssemiconductorproductsanddisclaimerstheretoappearsattheendofthisdatasheet.
PRODUCTIONDATAinformationiscurrentasofpublicationdate.
Copyright©2005–2007,TexasInstrumentsIncorporated
ProductsconformtospecificationsperthetermsoftheTexas
Instrumentsstandardwarranty.Productionprocessingdoesnot
necessarilyincludetestingofallparameters.
www.ti.com
ABSOLUTEMAXIMUMRATINGS
(1)
ELECTRICALCHARACTERISTICS
ADS8504
SLAS434A–JUNE2005–REVISEDJUNE2007
Thesedeviceshavelimitedbuilt-inESDprotection.Theleadsshouldbeshortedtogetherorthedeviceplacedinconductivefoam
duringstorageorhandlingtopreventelectrostaticdamagetotheMOSgates.
PACKAGE/ORDERINGINFORMATION
(1)
MINIMUM
NOMINIMUMSPECIFICATION
RELATIVEPACKAGEPACKAGEORDERINGTRANSPORT
PRODUCTMISSINGSINADTEMPERATURE
ACCURACYLEADDESIGNATORNUMBERMEDIA,QTY
CODE(dB)RANGE
(LSB)
ADS8504IBDWTube,20
ADS8504IB±0.451272-40°Cto85°CSO-28DW
ADS8504IBDWRTapeandReel,1000
(1)Forthemostcurrentpackageandorderinginformation,seethePackageOptionAddendumattheendofthisdocument,orseetheTI
websiteatwww.ti.com.
overoperatingfree-airtemperaturerange(unlessotherwisenoted)
(2)
ADS8504
AnaloginputsV
IN
±25V
CAP+V
ANA
+0.3VtoAGND2-0.3V
REFIndefiniteshorttoAGND2,momentaryshorttoV
ANA
GroundvoltagedifferencesDGND,AGND1,AGND2±0.3V
V
ANA
6V
V
DIG
toV
ANA
0.3V
V
DIG
6V
Digitalinputs-0.3Vto+V
DIG
+0.3V
Maximumjunctiontemperature165°C
Internalpowerdissipation825mW
Leadtemperature(soldering,1,6mmfromcase,10seconds)260°C
(1)Stressesbeyondthoselistedunder"absolutemaximumratings"maycausepermanentdamagetothedevice.Thesearestressratings
only,andfunctionaloperationofthedeviceattheseoranyotherconditionsbeyondthoseindicatedunder"recommendedoperating
conditions"isnotimplied.Exposuretoabsolute-maximum-ratedconditionsforextendedperiodsmayaffectdevicereliability.
(2)Allvoltagevaluesarewithrespecttonetworkgroundterminal.
T
A
=-40°Cto85°C,f
s
=250kHz,V
DIG
=V
ANA
=5V,usinginternalreference(unlessotherwisenoted)
PARAMETERTESTCONDITIONSMINTYPMAXUNIT
Resolution12Bits
ANALOGINPUT
Voltagerange±10V
Impedance11.5kΩ
Capacitance50pF
THROUGHPUTSPEED
ConversioncycleAcquireandconvert4µs
Throughputrate250kHz
DCACCURACY
INLIntegrallinearityerror-0.450.45LSB
(1)
DNLDifferentialllinearityerror-0.450.45LSB
(1)
Nomissingcodes12Bits
Transitionnoise
(2)
0.1LSB
(1)LSBmeansleastsignificantbit.Forthe12-bit,±10-VinputADS8504,oneLSBis4.88mV.
(2)Typicalrmsnoiseatworstcasetransitionsandtemperatures.
2
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ADS8504
SLAS434A–JUNE2005–REVISEDJUNE2007
ELECTRICALCHARACTERISTICS(continued)
T
A
=-40°Cto85°C,f
s
=250kHz,V
DIG
=V
ANA
=5V,usinginternalreference(unlessotherwisenoted)
PARAMETERTESTCONDITIONSMINTYPMAXUNIT
Full-scaleerror
(3)(4)
Int.Ref.-0.250.25%FSR
Full-scaleerrordriftInt.Ref.±7ppm/°C
Full-scaleerror
(3)(4)
Ext.2.5-VRef.-0.250.25%FSR
Full-scaleerrordriftExt.2.5-VRef.±2ppm/°C
Bipolarzeroerror
(3)
-11LSB
Bipolarzeroerrordrift±0.4ppm/°C
Powersupplysensitivity-0.50.5
+4.75V<V
D
<+5.25VLSB
(V
DIG
=V
ANA
=V
D
)
ACACCURACY
SFDRSpurious-freedynamicrangef
I
=45kHz8694dB
(5)
THDTotalharmonicdistortionf
I
=45kHz-95-86dB
f
I
=45kHz7273dB
SINADSignal-to-(noise+distortion)
–60-dBInput32dB
SNRSignal-to-noiseratiof
I
=45kHz7273dB
Full-powerbandwidth
(6)
500kHz
SAMPLINGDYNAMICS
Aperturedelay5ns
TransientresponseFSStep2µs
Overvoltagerecovery
(7)
150ns
REFERENCE
Internalreferencevoltage2.482.52.52V
Internalreferencesourcecurrent(mustuse
1µA
externalbuffer)
Internalreferencedrift8ppm/°C
Externalreferencevoltagerangeforspecified
2.32.52.7V
linearity
ExternalreferencecurrentdrainExt.2.5-VRef.100µA
DIGITALINPUTS
Logiclevels
V
IL
Low-levelinputvoltage-0.30.8V
V
IH
High-levelinputvoltage2.0V
DIG
+0.3VV
I
IL
Low-levelinputcurrent±10µA
I
IH
High-levelinputcurrent±10µA
DIGITALOUTPUTS
Dataformat(Parallel12-bits)
Datacoding(Binary2'scomplement)
V
OL
Low-leveloutputvoltageI
SINK
=1.6mA0.4V
V
OH
High-leveloutputvoltageI
SOURCE
=500µA4V
LeakagecurrentHi-Zstate,V
OUT
=0VtoV
DIG
±5µA
OutputcapacitanceHi-Zstate15pF
DIGITALTIMING
Busaccesstiming83ns
(3)AsmeasuredwithfixedresistorsshowninFigure24.Adjustabletozerowithexternalpotentiometer.
(4)Full-scaleerroristheworstcaseof-full-scaleor+full-scaledeviationfromidealfirstandlastcodetransitions,dividedbythetransition
voltage(notdividedbythefull-scalerange)andincludestheeffectofoffseterror.
(5)AllspecificationsindBarereferredtoafull-scale±10-Vinput.
(6)Full-powerbandwidthisdefinedasthefull-scaleinputfrequencyatwhichsignal-to-(noise+distortion)degradesto60dB,or10bitsof
accuracy.
(7)Recoverstospecifiedperformanceafter2xFSinputovervoltage.
3
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Model: ADS8504

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